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Authors: M.C. Lucas-Estan, J.L. Maestre, B. Coll-Perales, J. Gozalvez, I. Lluvia
Journal title: 2018 IEEE 23rd International Conference on Emerging Technologies and Factory Automation (ETFA)
Journal publisher: IEEE
Published year: 2018
Published pages: 1075-1078
DOI identifier: 10.1109/etfa.2018.8502497
ISBN:978-1-5386-7108-5
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