A blockchain-based framework for trusted quality data sharing towards zero-defect manufacturing

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Authors: Mauro Isaja, Phu Nguyen, Arda Goknil, Sagar Sen, Erik Johannes Husom, Simeon Tverdal, Abhilash Anand, Yunman Jiang, Karl John Pedersen, Per Myrseth, Jørgen Stang, Harris Niavis, Simon Pfeifhofer, Patrick Lamplmair

Journal title: Computers in Industry

Journal publisher: Elsevier BV

Published year: 2023

DOI identifier: 10.1016/j.compind.2023.103853

ISSN: 0166-3615