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Authors: Davide Brunelli, Tullio Salmon Cinotti, Hugo Woehrl, Cristiano Aguzzi, Federico Montori, Luca Benini
Journal title: 2019 AEIT International Annual Conference (AEIT)
Journal publisher: IEEE
Published year: 2019
Published pages: 1-6
DOI identifier: 10.23919/AEIT.2019.8893354
ISBN:978-8-8872-3745-0
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