A framework for inspection of dies attachment on PCB utilizing machine learning techniques

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Authors: Thanasis Vafeiadis, Nikolaos Dimitriou, Dimosthenis Ioannidis, Tracy Wotherspoon, Gregory Tinker, Dimitrios Tzovaras

Journal title: Journal of Management Analytics

Journal number: 5/2

Journal publisher: Taylor & Francis

Published year: 2018

Published pages: 81-94

DOI identifier: 10.1080/23270012.2018.1434425

ISSN:2327-0012

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Zero-defect manufacturing strategies towards on-line production management for European factories
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