A Deep Learning framework for simulation and defect prediction applied in microelectronics

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Authors: Nikolaos Dimitriou, Lampros Leontaris, Thanasis Vafeiadis, Dimosthenis Ioannidis, Tracy Wotherspoon, Gregory Tinker, Dimitrios Tzovaras

Journal title: Simulation Modelling Practice and Theory

Journal number: 100

Journal publisher: Elsevier BV

Published year: 2020

Published pages: 102063

DOI identifier: 10.1016/j.simpat.2019.102063

ISSN:1569-190X