Fault Diagnosis in Microelectronics Attachment Via Deep Learning Analysis of 3-D Laser Scans

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Authors: Nikolaos Dimitriou, Lampros Leontaris, Thanasis Vafeiadis, Dimosthenis Ioannidis, Tracy Wotherspoon, Gregory Tinker, Dimitrios Tzovaras

Journal title: IEEE Transactions on Industrial Electronics

Journal number: 67/7

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2020

Published pages: 5748-5757

DOI identifier: 10.1109/tie.2019.2931220

ISSN:0278-0046