Modeling the Dependency of Analog Circuit Performance Parameters on Manufacturing Process Variations with Applications in Sensitivity Analysis and Yield Prediction

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Authors: Elena-Diana Sandru, Emilian David, Ingrid Kovacs, Andi Buzo, Corneliu Burileanu, Georg Pelz

Journal title: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2021

Published pages: 1-1

DOI identifier: 10.1109/tcad.2021.3054804

ISSN:0278-0070

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