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Authors: Peter Stich, Rebecca Busch, Michael Wahl, Christian Weber, Madjid Fathi
Journal title: 2021 IEEE International Conference on Electro Information Technology (EIT)
Journal publisher: IEEE
Published year: 2021
Published pages: 1-6
DOI identifier: 10.1109/eit51626.2021.9491836
ISBN:978-1-6654-1846-1
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