Correlating electrical and process parameters for yield detractors’ detection

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Authors: Ingrid Kovacs, Marina Topa, Ciprian Pop, Elena-Diana Sandru, Andi Buzo, Georg Pelz

Journal title: 2020 International Symposium on Electronics and Telecommunications (ISETC)

Journal publisher: IEEE

Published year: 2020

Published pages: 1-4

DOI identifier: 10.1109/isetc50328.2020.9301121

ISBN:978-1-7281-9513-1

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