Simulation-based Evaluation of Lot Release Policies in a Power Semiconductor Facility - A Case Study

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Authors: Allgeier, Henriette; Flechsig, Christian; Lohmer, Jacob; Lasch, Rainer; Schneider, Germar; Zettler, Benjamin

Journal title: Proceedings of the 2020 Winter Simulation Conference

Journal publisher: IEEE

Published year: 2020

DOI identifier: 10.5281/zenodo.4011587