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Authors: Peter Stich, Michael Wahl, Peter Czerner, Christian Weber, Madjid Fathi
Journal title: 2020 IEEE International Conference on Electro Information Technology (EIT)
Journal publisher: IEEE
Published year: 2020
Published pages: 609-614
DOI identifier: 10.1109/eit48999.2020.9208250
ISBN:978-1-7281-5317-9
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