Defect Recognition of Roll-to-Roll Printed Conductors Using Dark Lock-In Thermography and Localized Segmentation

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Authors: Zheng , Haitao; Zhou, Linghao; Marks, Ryan; Happonen, Tuomas; Kraft, Thomas

Journal title: Appl. Sci.

Journal publisher: MDPI

Published year: 2022

DOI identifier: 10.3390/app12042005

ISSN:2076-3417