How to Maximize the Registration Accuracy in R2R Processing

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Authors: Juha Sumen; Satu Ylimaula; Harmen Rooms; Antti Takaluoma; Marja Välimäki; Valentijn von Morgen; Thomas M. Kraft; Marja Vilkman

Journal title: Proceedings of the 2021 International Conference on Micro- and Nano-devices Enabled by R2R Manufacturing

Journal publisher: University of Texas at Austin

Published year: 2021

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Innovative manufacturing processes and in-line monitoring techniques for the OLED and thin film and organic photovoltaic industries (CIGS and OPV)
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