Simultaneous Dimensional and Analytical Characterization of Ordered Nanostructures

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Authors: P. Hönicke, Y. Kayser, K.V. Nikolaev, V. Soltwisch, J.E. Scheerder, C. Fleischmann, T. Siefke, A. Andrle, G. Gwalt, F. Siewert, J. Davis, M. Huth, A. Veloso, R. Loo, D. Skroblin, M. Steinert, A. Undisz, M. Rettenmayr, B. Beckhoff

Journal title: Small

Journal number: 16136810

Journal publisher: Wiley - V C H Verlag GmbbH & Co.

Published year: 2021

Published pages: 2105776

DOI identifier: 10.1002/smll.202105776

ISSN: 1613-6810

Structured mapping
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