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Authors: P. Kremer, H. R. Nohooji, J. L. Sánchez-López, H. Voos
Journal title: IEEE Access
Journal number: 21693536
Journal publisher: Institute of Electrical and Electronics Engineers Inc.
Published year: 2022
DOI identifier: 10.48550/arxiv.2208.10768
ISSN: 2169-3536
