Surface Topography of Si/TiO2 Stacked Layers on Silicon Substrate Deposited by KrF Excimer Laser Ablation

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Authors: C.C. Moise, A. Pantazi, G.V. Mihai, A. Jderu, M. Bercu, A.A. Messina, M. Enachescu

Journal title: Coatings

Journal number: 20796412

Journal publisher: MDPI Publishing Services

Published year: 2021

Published pages: 1350

DOI identifier: 10.3390/coatings11111350

ISSN: 2079-6412

Structured mapping
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