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Authors: Janusz Sitek, Marek Koscielski, Piotr Dawidowicz, Piotr Ciszewski, Mariia Khramova, Duc Nguyen Quang, Sergio Martinez
Journal title: 2017 21st European Microelectronics and Packaging Conference (EMPC) & Exhibition
Journal publisher: IEEE
Published year: 2017
Published pages: 1-7
DOI identifier: 10.23919/EMPC.2017.8346853
ISBN:978-0-9568086-4-6