Analysis of data remanence after Factory Reset, and sophisticated attacks on memory chips

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Authors: M. Khramova, S. Martinez, Blancco, FI

Journal title: Going Green - CARE INNOVATION 2018

Journal publisher: CARE ELectronics

Published year: 2018

ISBN:978-3-200-05942-9

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Sustainable Smart Mobile Devices Lifecycles through Advanced Re-design, Reliability, and Re-use and Remanufacturing Technologies
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