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Authors: P. Fantini, G. Tavola, M. Taisch, J. Barbosa, P. Leitao, Y. Liu, M. S. Sayed, N. Lohse
Journal title: IECON 2016 - 42nd Annual Conference of the IEEE Industrial Electronics Society
Journal publisher: IEEE
Published year: 2016
Published pages: 5711-5716
DOI identifier: 10.1109/IECON.2016.7793579
ISBN:978-1-5090-3474-1
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