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Authors: A. Cala, M. Foehr, D. Rohrmus, N. Weinert, O. Meyer, M. Taisch, F. Boschi, P. M. Fantini, P. Perlo, P. Petrali, J. Vallhagen
Journal title: IECON 2016 - 42nd Annual Conference of the IEEE Industrial Electronics Society
Journal publisher: IEEE
Published year: 2016
Published pages: 5735-5740
DOI identifier: 10.1109/IECON.2016.7793378
ISBN:978-1-5090-3474-1