High-Speed Tapping Mode AFM Utilizing Recovery of Tip-Sample Interaction

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Authors: J. Noom, C. Smith, G. J. Verbiest, A. J. Katan, O. Soloviev and M. Verhaegen

Journal title: IEEE Transactions on Nanotechnology

Journal number: vol. 22

Journal publisher: IEEE

Published year: 2023

Published pages: 273-279

DOI identifier: 10.1109/tnano.2023.3284654

ISSN: 1941-0085