On-the-fly image-level oversampling for imbalanced datasets of manufacturing defects

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Authors: S. Theodoropoulos, P. Zajek, J. M. Rozanec, D. Kyriazis, P. Tsanakas

Journal title: Springer, Machine Learning, Special Issue on Imbalanced Learning

Journal publisher: Springer Nature

Published year: 2024

DOI identifier: 10.1007/s10994-023-06498-4