Robust Anomaly Map Assisted Multiple Defect Detection with Supervised Classification Techniques

This is a publication. If there is no link to the publication on this page, you can try the pre-formated search via the search engines listed on this page.

Authors: Jože M. Rožanec; Patrik Zajec; Spyros Theodoropoulos; Erik Koehorst; Blaž Fortunat; Dunja Mladenić

Journal title: Part of Special Issue 22nd IFAC World Congress: Yokohama, Japan, July 9-14, 2023

Journal number: 32

Journal publisher: ScienceDirect

Published year: 2023

DOI identifier: 10.1016/j.ifacol.2023.10.1144