Data-Driven Analytics for Reliability in the Buildings-to-Grid Integrated System Framework: A Systematic Text-Mining-Assisted Literature Review and Trend Analysis

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Authors: A. Bachoumis; C. Mylonas; K. Plakas; M. Birbas; A. Birbas

Journal title: IEEE Access, Vol 11, Pp 130763-130787 (2023)

Journal number: ever year

Journal publisher: Institute of Electrical and Electronics Engineers Inc.

Published year: 2023

Published pages: 130763 - 130787

DOI identifier: 10.1109/access.2023.3335191

ISSN: 2169-3536