Pattern-based feature extraction for fault detection in quality relevant process control

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Authors: Serena Peruzzo, Mike Holenderski, Johan J. Lukkien

Journal title: 2017 22nd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA)

Journal publisher: IEEE

Published year: 2017

Published pages: 1-6

DOI identifier: 10.1109/etfa.2017.8247664

ISBN:978-1-5090-6505-9