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Authors: Erkki Jantunen, Jaime Campos, Pankaj Sharma, David Baglee
Journal title: 2017 2nd International Conference on System Reliability and Safety (ICSRS)
Journal publisher: IEEE
Published year: 2017
Published pages: 343-347
DOI identifier: 10.1109/ICSRS.2017.8272846
ISBN:978-1-5386-3322-9
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