Pilot line for advance process control with self-learning cross-process root cause analysis

This is a publication. If there is no link to the publication on this page, you can try the pre-formated search via the search engines listed on this page.

Authors: L. Custodio, Pedro Vasconcelos, Ricardo Gaio

Journal title: Proceedings of the 18th European Advanced Process Control and Manufacturing Conference (apc/m)

Journal publisher: 18th European Advanced Process Control and Manufacturing Conference (apc/m)

Published year: 2018