Optimal Wafer Dispatching based on Dynamic Programming

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Authors: Alessio Mosca, Giuseppe De Nicolao, Germar Schneider, Torsten Niekisch, Davide Raimondo

Journal title: Proceedings of the 18th European Advanced Process Control and Manufacturing Conference (apc/m)

Journal publisher: 18th European Advanced Process Control and Manufacturing Conference (apc/m)

Published year: 2018

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