A comparison of Supervised Approaches for Process Pattern Recognition in Analog Semiconductor Wafer Test Data

This is a publication. If there is no link to the publication on this page, you can try the pre-formated search via the search engines listed on this page.

Authors: Stefan Schrunner, Olivia Bluder, Andre Kästner, Roman Kern

Journal publisher: 17th IEEE International Conference on Machine Learning and Applications 2018 (ICMLA)

Published year: 2018