Who’s There? Evaluating Data Source Integrity and Veracity in IIoT Using Multivariate Statistical Process Control

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Authors: Iñaki Garitano, Mikel Iturbe, Enaitz Ezpeleta, Urko Zurutuza

Journal title: Lectures on Quantum Statistics - With Applications to Dilute Gases and Plasmas

Journal number: 953

Journal publisher: Springer International Publishing

Published year: 2019

Published pages: 181-198

DOI identifier: 10.1007/978-3-030-12330-7_9

ISBN:978-3-030-05733-6