Tapping AFM measurements artefacts in the acquisition of high-aspect-ratio rectangular nano structures using dedicated sharp tips

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Authors: Loaldi, Dario; Quagliotti, Danilo; Calaon, Matteo; Czolkos, Ilja; Johansson, Alicia; Nielsen, Theodor and Tosello, Guido

Journal publisher: euspenÂ’s 19th International Conference & Exhibition

Published year: 2019