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Authors: Dario Loaldi, Francesco Regi, Dongya Li, Nikolaos Giannekas, Matteo Calaon, Yang Zhang, Guido Tosello
Journal title: Nanomanufacturing and Metrology
Journal publisher: Springer
Published year: 2021
DOI identifier: 10.1007/s41871-021-00105-7
ISSN:2520-811X