Debugging approach for IEC 61499 control applications in FBME

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Authors: D. Akifev, T. Liakh, P. Ovsiannikova, R. Sorokin and V. Vyatkin

Journal title: 2023 IEEE 32nd International Symposium on Industrial Electronics (ISIE)

Journal publisher: ΙΕΕΕ

Published year: 2023

DOI identifier: 10.1109/ISIE51358.2023.10228129

ISSN: 2163-5145