An Outline of a Complementary Inspection System for Micro-Electro-Mechanical System (MEMS) Devices Based on Radiography and Plenoptic Camera

Summary

This is a publication. If there is no link to the publication on this page, you can try the pre-formated search via the search engines listed on this page.

Authors: Alvin CHONG, Guojin FENG, Jamil KANFOUD and Tat-Hean GAN

Journal title: Advances in Transdisciplinary Engineering

Journal number: Volume 8: Advances in Manufacturing Technology XXXII

Journal publisher: IOS Press

Published year: 2018

Published pages: 33 - 38

DOI identifier: 10.3233/978-1-61499-902-7-33

ISSN:2352-751X

Results type(s)
Unfold all
/
Fold all
Report - Video - Presentation - Publication....?
Structured mapping
Unfold all
/
Fold all