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Authors: Gabor Farkas, Marton C. Bein, Lajos Gaal
Journal title: 2016 22nd International Workshop on Thermal Investigations of ICs and Systems (THERMINIC)
Journal publisher: IEEE
Published year: 2016
Published pages: 181-186
DOI identifier: 10.1109/THERMINIC.2016.7749049
ISBN:978-1-5090-5451-0