Different questions of today's LED thermal testing procedures

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Authors: Gusztav Hantos, Janos Hegedus, Andras Poppe

Journal title: 2018 34th Thermal Measurement, Modeling & Management Symposium (SEMI-THERM)

Journal publisher: IEEE

Published year: 2018

Published pages: 63-70

DOI identifier: 10.1109/SEMI-THERM.2018.8357354

ISBN:978-1-5386-4402-7