Successive network reduction method for parametric transient results

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Authors: Marton Nemeth, Andras Poppe

Journal title: 2017 Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP)

Journal publisher: IEEE

Published year: 2017

Published pages: 1-6

DOI identifier: 10.1109/DTIP.2017.7984460

ISBN:978-1-5386-2952-9