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Authors: Ruihang Dai, Aviv Cohen, Thomas Stoll, Katrin Wudy, Fadi Kizel
Journal title: Elsevier Measurement
Journal number: Vol. 242 Part B
Journal publisher: Elsevier BV
Published year: 2025
DOI identifier: 10.1016/j.measurement.2024.115896
ISSN: 0263-2241
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