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Authors: Sri Vishnu Subramaniam, Bas van der Wiel, Tobias Sauermann, Dimitar Kutsarov, Pavel Schilinsky, Ralph Pätzold, Reinhard R. Baumann, Sebastian B. Meier
Journal title: ACS Applied Electronic Materials
Journal number: 2/3
Journal publisher: American Chemical Society
Published year: 2020
Published pages: 756-762
DOI identifier: 10.1021/acsaelm.9b00826
ISSN:2637-6113
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