Development and calibration of the on-line process monitoring for material of interest (1)

T4.3 Development and calibration of the on-line process monitoring for material of interest (FAU,CHALM, POLITO, EOS) T4.3.1 Development and calibration of the on-line process monitoring for material of interest for EBM process (FAU) FAU will employ and assess the new electron optical observation (ELO) tool for process observation and fault detection. The spatial resolution of the ELO will be determined with the help of specific calibration plates. The scanning strategy and parameters (beam current and exposure time) for taking ELO information will be adapted to and optimized for the different materials of interest. For calibration, the ELO information will be directly compared with microstructural investigations and data from computed tomography.