Centre Suisse d'Electronique et de Microtechnique SA - (Coördinator)
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A Complimentary Inspection Technique based on Computer Tomography and Plenoptic Camera for MEMS Components
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BRUNEL UNIVERSITY LONDON
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EXCILLUM AB
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LEITAT
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MICROSEMI SEMICONDUCTOR LIMITED
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PHILIPS ELECTRONICS NEDERLAND B.V.
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POLYTEC LIMITED
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RAYTRIX GMBH
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TEKNOLOGIAN TUTKIMUSKESKUS VTT OY
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TWI Ltd
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aixACCT Systems GmbH
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