An Improved Capsule Network (WaferCaps) for Wafer Bin Map Classification Based on DCGAN Data Upsampling

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Authors: Abd Al Rahman M. Abu Ebayyeh; Sebelan Danishvar; Alireza Mousavi

Journal title: IEEE

Journal number: 08946507

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2021

Published pages: 50-59

DOI identifier: 10.1109/tsm.2021.3134625

ISSN:0894-6507