A blockchain-based framework for trusted quality data sharing towards zero-defect manufacturing

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Authors: Mauro Isaja; Phu Nguyen; Arda Goknil; Sagar Sen; Erik Johannes Husom; Simeon Tverdal; Abhilash Anand; Yunman Jiang; Karl John Pedersen; Per Myrseth; Jørgen Stang; Harris Niavis; Simon Pfeifhofer; Patrick Lamplmair

Journal title: Computers in Industry

Journal number: Volume 146, April 2023, 103853

Journal publisher: Elsevier BV

Published year: 2023

DOI identifier: 10.1016/j.compind.2023.103853

ISSN: 0166-3615

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