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Authors: Evangelos Arvanitakis, Michael Petychakis, Evmorfia Biliri, Ariadni Michalitsi-Psarrou, Panagiotis Kokkinakos, Fenareti Lampathaki, Dimitrios Askounis
Journal title: 2016 11th International Conference on Availability, Reliability and Security (ARES)
Journal publisher: IEEE
Published year: 2016
Published pages: 827-833
DOI identifier: 10.1109/ARES.2016.99
ISBN:978-1-5090-0990-9
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