Integration Challenges for the Deployment of a MultiStage Zero-Defect Manufacturing Architecture

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Authors: Giacomo Angione, Cristina Cristalli, José Barbosa, Paulo Leitão

Journal title: Proceedings of the 2019 IEEE 17th International Conference on Industrial Informatics (INDIN) Helsinki-Espoo, Finland

Journal publisher: IEEE

Published year: 2019

Published pages: 1615-1620

ISBN:978-1-7281-2927-3

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