Smart measurement systems for Zero-Defect Manufacturing

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Authors: Paolo Chiariotti, Paolo Castellini, Enrico Concettoni, Matteo Fitti, Giulia Lo Duca, Elisa Minnetti, Nicola Paone, Cristina Cristalli

Journal title: 2018 IEEE 16th International Conference on Industrial Informatics (INDIN)

Journal publisher: IEEE

Published year: 2018

Published pages: 834-839

DOI identifier: 10.1109/indin.2018.8472016

ISBN:978-1-5386-4829-2