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Authors: Paolo Chiariotti, Matteo Fitti, Paolo Castellini, Saverio Zitti, Marco Zannini, Nicola Paone
Journal title: IEEE Instrumentation & Measurement Magazine
Journal number: 21/6
Journal publisher: Institute of Electrical and Electronics Engineers
Published year: 2018
Published pages: 22-28
DOI identifier: 10.1109/mim.2018.8573589
ISSN:1094-6969
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