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Authors: Francisco Ambrosio Garcia; Pavel Eremeev; Hendrik Devriendt; Frank Naets; Hüseyin Metin; Merih Özer
Journal title: 7th International Conference on Control, Automation and Diagnosis
Journal publisher: IEEE
Published year: 2023
DOI identifier: 10.1109/iccad57653.2023.10152364
ISBN: 979-8-3503-4707-4
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