A decade of research on patterns and architectures for IoT security

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Authors: Tanusan Rajmohan; Phu H. Nguyen; Nicolas Ferry

Journal title: Cybersecurity

Journal number: 5

Journal publisher: Springer

Published year: 2022

ISSN: 2523-3246

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Data Reliability and Digitally-enhanced Quality Management for Zero Defect Manufacturing in Smart Factories and Ecosystems
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