Evaluating the Impact of Dynamic Qualification Management in Semiconductor Manufacturing

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Authors: Antoine Perraudat, Stephane Dauzere-Peres, Philippe Vialletelle

Journal title: 2019 Winter Simulation Conference (WSC)

Journal number: Yearly

Journal publisher: IEEE

Published year: 2019

Published pages: 2336-2347

DOI identifier: 10.1109/wsc40007.2019.9004687

ISBN:978-1-7281-3283-9